|
With over 250 employees based in their headquarters in Zelenograd close to Moscow, NT-MDT has 20 years experience in the SPM market. The company has over 2000 installations across 59 countries, and their broad range of products for SPM cover a wide range of different applications, requirements and budget ranges. NT-MDT strives for next-generation SPM technology, and has moved towards a modularity that allows a university or industrial lab to start with a cost-effective core product and build up to a multi-user facility with many applications and imaging modes. A key development is the combination of SPM with related technologies that has resulted in nanotomography and spectroscopy-based instruments that meld the world of imaging with the world of chemical analysis. NT-MDT believes passionately in pushing the envelope for rapid innovation while still delivering superb customer service.
NT-MDT Europe is based on the High Tech Campus in Eindhoven, the Netherlands and combines a dedicated team of 10 product specialists with demonstration facilities for all SPM platforms. Scanwel provides local sales, demonstration and support for NT-MDT in the UK and Ireland. With telephone and e-mail support from Scanwel and NT-MDT Europe, combined with NT-MDT's unique "ask-online" service, we aim to provide an unsurpassed user experience.
NT-MDT product line
|
SOLVER NEXT is the first AFM to offer a new concept in general purpose Scanning Probe Microscopy. This new design offers "on-board expertise" opening the way for all user levels to acquire quality SPM images in a short amount of time.
Features include:
- AFM and STM on one platform with automated head exchange
- Automated laser alignment
- Integrated sample enclosure
- Closed loop scanners
- Motorised sample positioning
- Optional imaging in liquid
- Optional electrical modes / MFM /lithography
|
|
NTEGRA Spectra
AFM / CONFOCAL RAMAN & FLUORESCENCE / SNOM / TERS
Integration: The key to the new sciences
Change happens at interfaces and today’s most exciting changes in microscopy are happening where multiple technologies are interfaced together. NTEGRA Spectra is a prime example, uniting the full power of atomic force microscopy (AFM), confocal Raman and fluorescence microscopy and scanning near-field optical microscopy (SNOM) in one platform.
Simultaneous AFM and confocal Raman / Fluorescence imaging
NTEGRA Spectra supports most of the existing AFM modes (more than 30) providing comprehensive information about physical properties of the sample with nanometer scale resolution: local stiffness, elasticity, conductivity, capacitance, magnetization, surface potential and work function, friction, piezoresponse etc. Simultaneously with AFM, confocal Fluorescence and Raman measurements provide information about sample chemical composition, crystal structure and its orientation, presence of impurities and defects, macromolecular conformation, and so on. Measurements can be performed either through upright or inverted light excitation geometries. The sample can be in a controlled atmosphere or in a liquid environment, all under controlled temperature. Complete Raman /fluorescence spectrum is recorded in each point of 2D / 3D scan with further powerful software analysis. Due to the excellent microscopy performance of the NTEGRA Spectra, 3D spectral distribution can be studied with the spatial resolution reaching the theoretical limit.
Microscopy and spectroscopy at the molecular scale
Diffraction limited spatial resolution and weakness of Raman signal are the two major challenges in Raman microscopy. When using visible light, resolution of classical confocal microscopy does not go below 200 nm. The Raman signal is often only 1/millionth of the strength of a fluorescence signal. The new world of nanotechnology has disclosed a fascinating phenomenon: the electromagnetic field can be strongly enhanced near nanometer-scale metal asperities (“nano-antennas”). The resulting effects are called Surface Enhanced Raman Scattering (SERS) and, when done in conjunction with an SPM tip, one can get Tip-Enhanced Raman Scattering (TERS). By using a specially prepared sharp needle tip, NTEGRA Spectra can multiply the Raman signal strength by a few orders of magnitude from a precisely scanned, localized spot on the surface several nanometers in diameter. Even single molecules can be detected and recognized by their spectra. Lateral resolution of Raman (TERS) and fluorescence maps is no longer limited by light diffraction and can be less than 15 nm.
|
|
The NTEGRA is a revolutionary concept in SPM. It was designed specifically to form an SPM base platform for integration with cutting-edge analysis technologies such as spectroscopy and other leading analytical techniques. The NTEGRA allows the sample of interest to be studied by powerful and up-to-the-minute non-SPM methods without compromising SPM quality. It uniquely integrates SPM with optical observation, chemical composition mapping, and even nano-tomography, opening a new universe of correlative analyses applicable to all areas of modern science. Furthermore, its open architecture in hardware, software and signal integration provides a portal for you to customize and expand this list to fit your applications. |
|
NTEGRA Solaris combines three different microscopy techniques: light, Scanning Nearfield Optical Microscopy (SNOM), and Atomic Force Microscopy (AFM).
Integration at this advanced level
creates enormous design challenges because the conventional light microscope which uses standard
optics and mechanics cannot provide the accuracy, precision of movement, and stability required for scanning probe microscopy or the efficiency necessary to collect the weak SNOM signal.When they
invented NTEGRA Solaris, NT-MDT engineers took a unique approach. They built a stable, rigid light
microscope objective right into the base of the SPM. The result: high resolution imaging with none of
the optical microscope instability. Coupling this exceptional stability with sensitive
detection makes NTEGRA Solaris perfect for advanced measurements, even at the molecular scale.
|
|
*NEW*
NTEGRA Life is a NanoLaboratory which integrates Atomic Force Microscopy with an inverted optical microscope with NA 0.55 condensers. It is used for biological and medical researches in physiological conditions.
NTEGRA Life consists of the measurement head and positioning stage.
The motorized measurement head contains a XYZ scanner (100x100x20 um) and is a fully automated system. For ease of use the NTEGRA Life provides automatic alignment of the Atomic Force Microscope (AFM) optical system. It allows one to operate it without manual adjusting the cantilever.
The motorised stage allows XY sample positioning on an area of 20 x 20 mm with 0.07 um step size. It has also an optional plug in module for mounting 100 um XY or Z scanners.
The stage contains additional motorized positioning of measuring head relative to the sample.
Two different sample holders that are supported; a universal holder for a Petri dish or microscope slide, or a sample holder for a perfusion liquid cell with inlets for gas and fluid flow.
Due to enhanced construction and sample access the NTEGRA Life supports optical microscopy modes such as: Fluorescence, Bright field, Dark field, DIC and Phase contrast and the AFM modes: AFM (Contact + Intermittent Contact), Lateral Force Microscopy, Adhesion Force Imaging, Force Modulation, Phase Imaging, nano manipulation, lithography and Force Distance curves.
The sample can also be viewed in Fluorescence mode simultaneously with the nanometer scaled landscape of the surface. |
|
*NEW*
The Solver Nano SPM, is your key to the minuscule world. Developed for use by even first-time microscope users, it can navigate through the step-by-step operation. This device is designed to capture the students interest in science and train future nanotechnologists using both AFM and STM techniques.
Robust and foolproof, Solver Nano is designed for interdisciplinary education with a broad understanding of different fields of nanoscience. Owing to this approach, cells, viruses, bacteria can be investigated as well as metals, semiconductors, dielectrics, polymers etc.
Equipped with a different scanning head, Solver Nano can be converted into a dual purpose instrument for scientific research. |
|
