{"id":3083,"count":14,"description":"SNOM \u2014 scanning near-field optical microscope, scanning near-field optical microscopy. In near-field optical microscopy uses different principles of construction of the image of object, which allow to overcome the difficulties associated with diffraction of light and to realize a spatial resolution of 10 nm and better. Higher resolution imaging is achieved by detecting scattering of light from the object under study at distances smaller than the wavelength of light. In the case that the probe (detector) of the near-field microscope provided with a device for the spatial scan, the scanning device called optical near-field microscope. This microscope allows to obtain a raster image of surfaces and objects with a resolution below the diffraction limit.","link":"https:\/\/www.scanwel.com\/shop\/product-category\/afm-probes-accessories\/snom-probes\/","name":"SNOM Probes","slug":"snom-probes","taxonomy":"product_cat","parent":65,"meta":[],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v21.3 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>SNOM Probes Archives - Scanwel Shop<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.scanwel.com\/shop\/product-category\/afm-probes-accessories\/snom-probes\/\" \/>\n<meta property=\"og:locale\" content=\"en_GB\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"SNOM Probes Archives - Scanwel Shop\" \/>\n<meta property=\"og:description\" content=\"SNOM \u2014 scanning near-field optical microscope, scanning near-field optical microscopy. In near-field optical microscopy uses different principles of construction of the image of object, which allow to overcome the difficulties associated with diffraction of light and to realize a spatial resolution of 10 nm and better. Higher resolution imaging is achieved by detecting scattering of light from the object under study at distances smaller than the wavelength of light. In the case that the probe (detector) of the near-field microscope provided with a device for the spatial scan, the scanning device called optical near-field microscope. 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