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Contact Probes with force constant 0.01-0.5N/m

£333.00£905.00

High Resolution Silicon AFM Cantilevers CSG10 series are designed for Contact applications. Typical Resonant Frequency 22 kHz (guaranteed range 8-39kHz), Typical Force Constant 0.11 N/m (guaranteed range 0.01-0.5N/m). Cantilever has Au reflective side coating to increase laser signal.
Probes are also available with no coating as well as with conductive tip coating.
Probes are packed in boxes with 15 and 50 pieces. Amount discount is included in the package price.

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SKU: CSG10 Category:
More Information
Pack Size 15, 50
Cantilever Length Range um 10
Cantilever Length um 225
Cantilever Number 1 rectangular
Cantilever Thickness Range um 0.75
Cantilever Thickness um 1.25
Cantilever Width Range um 7.5
Cantilever Width um 47.5
Chip Size mm 3.6x1.6x0.3
Force Constant Max N/m 0.5
Force Constant Min N/m 0.01
Force Constant Typical N/m 0.11
Material Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Reflective Side Coating Au
Resonant Frequency Max khz 39
Resonant Frequency Min khz 8
Resonant Freq Typical khz 22
Tip Coating No
Tip Curvature Radius N/m Typical 6nm, guaranteed 10nm