The cantilever is a key element of any scanning probe microscope, vital to obtaining high quality images and successful operation of the system. This is the basic measuring element of many types of probe microscopes. The right choice of the cantilever is one of the most important conditions for obtaining good AFM images.
The most important component of AFM (Atomic force microscope) are the scanning probes of the cantilevers. The cantilever is a flexible beam (175х40х4 µm — average data) with a certain stiffness coefficient k (10-3 – 10 N/m), which is a micro needle.
