To get the best performance from your atomic force microscope (AFM), it is important to calibrate the system regularly to ensure the scale of the images is correct in all three axes and the tip is sufficiently sharp to avoid artefacts. The Scanwel range of calibration gratings puts the tools at your disposal. Gratings are available at a variety of length scales to match the image size as closely as possible
| Name | SKU | Step Height nm | Period um | Price | Qty |
|---|---|---|---|---|---|
| 6H-SiC(0001) Z axis calibration sample with 0.75 nm steps | SiC/0.75 | Step Height nm: 0.75 | Period um: n/a | £329.76 | |
| 6H-SiC(0001) Z axis calibration sample with 1.5 nm steps | SiC/1.5 | Step Height nm: 1.5 | Period um: n/a | £395.71 | |
| Grating for checking tip condition with 3 micron period array of sharp tips | TGT1 | Step Height nm: 300-500 | Period um: 3 +/-0.05 | £286.00 | |
| Sub-Micron XY axis Calibration Grating with 278nm period | TDG01 | Step Height nm: >55 | Period um: 278 +/-1 | £494.21 | |
| XY single axis calibration grating with 3 micron period | TGG1 | Step Height nm: ~1500 | Period um: 3 +/-0.05 | £190.00 | |
| XY/Lateral 2 axis calibration grating with 3 micron period | TGX1 | Step Height nm: 600 | Period um: 3 +/-0.05 | £190.00 | |
| XYZ calibration grating with 3 micron period and 20nm height | TGQ1 | Step Height nm: 20 +/-1.5 | Period um: 3 +/-0.05 | £286.00 | |
| Z axis calibration grating with 110nm height | TGZ2 | Step Height nm: 110 | Period um: 3 +/-0.05 | £165.60 | |
| Z axis calibration grating with 1517nm height | TGZ4 | Step Height nm: 1517 | Period um: 3 +/-0.05 | £165.60 | |
| Z axis calibration grating with 20nm height | TGZ1 | Step Height nm: 20 | Period um: 3 +/-0.05 | £138.00 | |
| Z axis calibration grating with 520nm height | TGZ3 | Step Height nm: 520 | Period um: 3 +/-0.05 | £165.60 |
