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Contact/SemiContact Probes with force constant 0.13-2 N/m and resonant frequency 26-76kHz

£333.00£905.00

Due to the medium values of force constant and resonant frequency the probes can be used in contact, semicontact and noncontact modes.
Specially designed for the applications when it’s not clearly defined which mode should be used for sample investigation or when it’s necessary to provide measurements in both modes of the same sample area without tip removal.

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SKU: CSG30 Category:
More Information
Pack Size 15, 50
Cantilever Length Range um 10
Cantilever Length um 225
Cantilever Number 1 rectangular
Cantilever Thickness Range um 1
Cantilever Thickness um 2
Cantilever Width Range um 7
Cantilever Width um 25
Chip Size mm 3.6x1.6x0.3
Force Constant Max N/m 2
Force Constant Min N/m 0.13
Force Constant Typical N/m 0.6
Material Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Reflective Side Coating Au
Resonant Frequency Max khz 76
Resonant Frequency Min khz 26
Resonant Freq Typical khz 48
Tip Coating No
Tip Curvature Radius N/m Typical 6nm, guaranteed 10nm